Session 4: Management of the risks that can be caused by EMI
The presenters of this session highlight recent research results from EU-funded MSCA project PETER. The session gives a wide look at different topics existing in EMI risk management. Pieces from risk management of safety critical systems are spiced up with more traditional obsolescence risk management needed for long lifespan products. These seemingly distant topics have at least one common feature: the EMI risks need to be managed to avoid costly failures!
Session 4, Speaker 1
Oskari Leppaaho, Doctoral Student, PETER project, Valeo, France
EMI risk management for EMC and functional safety in product design - What's the difference?
In the context of product design, EMI risk management can take two vastly different forms depending on its application. It can simply mean managing the risks related to the electromagnetic compatibility of the product or it can mean managing the safety risk caused by the product, when considering the effect of electromagnetic interference. This presentation will discuss both viewpoints and provide simple tools and methodologies to get started with risk management, noting that different tools and methods are needed.
It is next to impossible to use the same toolset for risk managing EMC and functional safety considering EMI. However, it will be seen that some generic risk management tools can be shared amongst them.
The EMC side will concentrate on risk prediction with the help of simulation tools taking a simple conducted immunity case with SPICE simulation as an example. The functional safety side will concentrate on the tools and understanding needed from an EMC engineer to interface with a functional safety team to contribute to the product safety design. Main tool used in there is the goal-structuring notation (GSN).
After the presentation, the participants are expected to have gained basic understanding of the two risk management areas and on the reasons why they need to be treated separately.
Session 4, Speaker 2
Lokesh Devaraj, Doctoral Student - PETER project - Horiba Mira Ltd
Adopting a risk-based EMC approach - Is it necessary, and how can it be done?
A risk-based EMC approach for complex systems includes the identification, estimation, and control and/or mitigation of the threat of electromagnetic (EM) disturbances causing system-critical malfunctions (e.g., safety and security) in electrical and electronic (E/E) components.
The recent IEEE standard 1848-2020 provides a set of requirements for the techniques and measures that can be used to reduce the risk of malfunctions due to EMI. However, for mobile systems within a dynamic EM environment, as experienced by road vehicles, estimation of the probability of EM disturbance(s) that can occur in the operational lifetime of a system is a prerequisite for managing or reducing the EM risk to acceptable levels. This presentation will provide a brief summary of the need for the adoption of risk-based approach, and discuss the challenges in quantifying the EMI risk level due to uncertainty of system EM environment.
Further, a new Bayesian multinet (BMN) model and EM environment characterization technique is introduced, to support the probability estimation of EMI causing malfunctions in E/E systems. The proposed BMN model is generic, and hence could enable the adoption of a risk-based EMC approach for critical systems in various domains such as military, automotive, defence, medicine, etc.
Session 4, Speaker 3
Mohammad Tishehzan, PETER Project, University of York
Incorporation of the electromagnetic environment in the Operational Design Domain
Electromagnetic Interference (EMI) is capable of diminishing the safety margin of a complex system in different ways. While traditionally, the hazards that emerged from EMI has been considered as a functional safety issue (i.e. malfunctions rooted in EMI), the impact of EMI on the Safety of Intended functionality (SOTIF) has not been explored to a similar extend.
The electromagnetic environment could affect the system’s perception of the surrounding world by providing insufficient or inadequate input data, which may lead to hazardous behaviour of the system while there is no anticipated EMI originated malfunction. Maintaining the SOTIF of a system requires the specification of the Operational Design Domain (ODD), which includes the conditions that a given system is designed for and allowed to operate in.
Considering the impact of the electromagnetic environment in SOTIF signifies the importance of specifying the electromagnetic environment explicitly in the ODD, which has not been considered in ODD taxonomies such as PAS1883 so far. In this presentation, the contribution of EMI in functional safety and SOTIF will be explained and compared.
Moreover, incorporation of the electromagnetic environment in the ODD, its role during development and operation and the potential approaches and challenges in its specification will be explored.
Session 4, Speaker 4
Qazi Mashaal Khan, Doctoral Student - PETER project - Ecole Superieure d’Electronique de l’Ouest (ESEO), France, and Institut National des Sciences Appliquees (INSA), France
Obsolescence in EMC Risk Assessment: The Need for ICIM-CPI Models
In recent years, the ever-changing developments in integrated circuit (IC) technology have increasingly challenged IC developers with confronting electromagnetic compatibility (EMC) problems. Therefore, their specific EMC characteristics and, in particular, their immunity to electromagnetic interference (EMI) are crucial for proper operation over the entire lifetime of a system. The high-risk factors due to EMC-related reliability can be aging, technological dispersion, and obsolescence.
This presentation will investigate and compare the electric fast transient (EFT) immunity of two-pin compatible, commercially available microcontrollers. The results will show that a more recent IC does not mean a higher EFT immunity, and further EMC analyses are to be performed, mainly when dealing with obsolescence. The non-linear ICIM-CPI (Integrated Circuit Immunity – Conducted Pulse Immunity) model is valuable to help simulate EMC risk assessment for whole printed circuit boards (PCB). An ICIM-CPI model, designed in Cadence software, will be presented for a custom-designed IC, showing the effect of aging or obsolescence. This will show the audience how this model can predict the failure of an IC when used in a customer application and under extreme environmental stresses (humidity & temperature).
After the presentation, the audience would have understood IC immunity, aging, obsolescence, and why we need models to overcome EMC issues.
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